| Autor: |
R. Hu, H. M. Manasevit, M. J. Zani, J.F. Burch, C. E. Platt, Rentschler Simon, S.M. Schwarzbek, K.P. Daly, J. Luine, D.C. St. John, W. D. Dozier, M.S. Wire, A.E. Lee |
| Rok vydání: |
1990 |
| Předmět: |
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| Zdroj: |
Science and Technology of Thin Film Superconductors 2 ISBN: 9781468413472 |
| DOI: |
10.1007/978-1-4684-1345-8_82 |
| Popis: |
We report on progress in several key areas necessary for the establishment of a circuit process for high-temperature superconductive electronics (HTSE). These include superconductor films, compatible dielectric layers, metallic contacts, and Josephson devices. Among the topics we cover are the properties of in situ YBCO films, the use of LaA1O3 as a thin film dielectric material, and the properties of several types of engineered microbridge structures that exhibit Josephson-effect behavior in high-quality films because of the introduction of localized disruption in the films. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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