Real-time investigations of selenization reactions in the system Cu-In-Al-Se
| Autor: | Stefan Jost, Frank Hergert, Ralph Enderle, Rainer Hock, M. Purwins |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Chalcopyrite
business.industry Annealing (metallurgy) chemistry.chemical_element Crystal growth Surfaces and Interfaces Crystal structure Condensed Matter Physics Microstructure Surfaces Coatings and Films Electronic Optical and Magnetic Materials Crystallography Semiconductor chemistry Aluminium visual_art Materials Chemistry visual_art.visual_art_medium Physical chemistry Electrical and Electronic Engineering Thin film business |
| Zdroj: | physica status solidi (a). 203:2581-2587 |
| ISSN: | 1862-6319 1862-6300 |
| DOI: | 10.1002/pssa.200669558 |
| Popis: | In this article we present results of a detailed study of selenization reactions in the quaternary system Cu-In-Al-Se and of the binary subsystem aluminum-selenium. The investigation of solid-state reactions involved in the formation of the compound semiconductor Cu(In,Al)Se 2 was performed using real-time X-ray diffraction (XRD) with a time resolution of 22.5 s while annealing an elemental layer stack of the metals covered with selenium. A temperature-resolved phase analysis shows that the formation of the semiconductor takes place via metal-selenides. Ex-situ XRD measurements of the processed thin films show a phase segregation concerning the aluminum content of the formed chalcopyrite. Subsequent Rietveld-refinement of real-time measurements reveals a formation reaction of the quaternary semiconductor Cu(In,Al)Se 2 from the γ-In 2 Se 3 related crystal structure of (Al,ln) 2 Se 3 and Cu 2 Se as educts. |
| Databáze: | OpenAIRE |
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