X-ray photoelectron diffraction investigation of the cleavage plane in -transition metal dichalcogenides
| Autor: | D. Stoltz, S. E. Stoltz |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Diffraction
Materials science Scattering Cleavage (crystal) Condensed Matter Physics Electronic Optical and Magnetic Materials Metal symbols.namesake Crystallography Transition metal visual_art X-ray crystallography visual_art.visual_art_medium symbols Electrical and Electronic Engineering Atomic physics van der Waals force Single crystal |
| Zdroj: | Physica B: Condensed Matter. 398:172-177 |
| ISSN: | 0921-4526 |
| DOI: | 10.1016/j.physb.2007.05.014 |
| Popis: | We present a detailed study of the three members of the 1 T-transition metal dichalcogenides: TiSe2, TaSe2 and TaS2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds. (c) 2007 Elsevier B.V. All rights reserved. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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