Vibrating Probe (AC) Methods in Atomic Force Microscopy

Autor:	C. B. Prater
Rok vydání:	1994
Předmět:	Lift (force) Kelvin probe force microscope Optics Materials science Piezoresponse force microscopy business.industry Electric field Atomic force acoustic microscopy Conductive atomic force microscopy Scanning capacitance microscopy business Non-contact atomic force microscopy
Zdroj:	Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 9781475793246
DOI:	10.1007/978-1-4757-9322-2_44
Popis:	The atomic force microscope is expanding its capabilities through the use of vibrating probe (AC) techniques. One mode of operation, called Tapping ModeTM oscillates the probe so that it lightly “taps” on the surface at the bottom of each oscillation cycle. This method virtually eliminates frictional forces between the probe and surface yet maintains the high resolution and ease of operation of the contact mode technique. Tapping mode can also be combined with noncontact methods to measure long-range forces like those from magnetic and electric fields. This paper describes a two-step process called Lift ModeTM where a computer records the sample surface topography for each scan line and then initiates a noncontact measurement by flying the probe a small distance above the recorded topography. this provides simultaneous and yet separate measurements of both the sample topography and the long-range forces above the sample.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9bf3a0092abbb4930edd26f23e1dc976 https://doi.org/10.1007/978-1-4757-9322-2_44 Zobrazit plný text záznamu