Mechanical Conversion for High-Throughput TEM Sample Preparation
Autor: | Lyudmila Zaykova-Feldman, Anthony B Kendrick, Thomas M. Moore |
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Rok vydání: | 2006 |
Předmět: | |
Zdroj: | Journal of Physics: Conference Series. 26:227-230 |
ISSN: | 1742-6596 1742-6588 |
DOI: | 10.1088/1742-6596/26/1/054 |
Popis: | This paper presents a novel method of direct mechanical conversion from lift-out sample to TEM sample holder. The lift-out sample is prepared in the FIB using the in-situ liftout Total Release™ method. The mechanical conversion is conducted using a mechanical press and one of a variety of TEM coupons, including coupons for both top-side and back-side thinning. The press joins a probe tip point with attached TEM sample to the sample coupon and separates the complete assembly as a 3mm diameter TEM grid, compatible with commercially available TEM sample holder rods. This mechanical conversion process lends itself well to the high through-put requirements of in-line process control and to materials characterization labs where instrument utilization and sample security are critically important. |
Databáze: | OpenAIRE |
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