Ion emission from solid electrolyte CsAg4Br2.68I2.32 film deposited on Ag-tip: Characteristics and applications
Autor: | Zhenguo Wang, Xiaomei Zeng, Dmitriy V. Suvorov, Gennady P. Gololobov, A. E. Ieshkin, Vasiliy O. Pelenovich, Dejun Fu, Wenbin Zuo, Alexander Tolstogouzov, Donghong Hu, Chuansheng Liu |
---|---|
Rok vydání: | 2019 |
Předmět: |
010302 applied physics
Materials science Analytical chemistry Nanoparticle Ion current 02 engineering and technology Electrolyte 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Evaporation (deposition) Acceleration voltage Ion source Surfaces Coatings and Films Ion 0103 physical sciences Rectangular potential barrier 0210 nano-technology Instrumentation |
Zdroj: | Vacuum. 167:382-388 |
ISSN: | 0042-207X |
DOI: | 10.1016/j.vacuum.2019.06.041 |
Popis: | We have developed a solid electrolyte ion source (SEIS) with CsAg4Br2.68I2.32 film deposited on a silver tip. In the paper, Ag+ ion emission was significantly enhanced and the ion current of 1.6 μA was obtained at 168 °C temperature and 20 kV accelerating voltage. I-T and I-U characteristics were well described by the field evaporation (FEV) model, and the surface potential barrier was estimated to be 0.19 eV. Experimental investigations of the Ag+ ion emission mechanisms revealed that the solid electrolyte film plays an important role of ion-transport system, and the emitted Ag+ ions were compensated by the ions diffusing from the silver reservoir (Ag-tip). The developed SEIS was exploited for the synthesis of Ag nanoparticles on Si surface. The average size of these nanoparticles was estimated 15.5 ± 0.3 nm, and the projected range Rp of the low-energy high-dose Ag+ ions implanted Si sample was found to be less than 5 nm using TOF-SIMS depth profiling. The future application of SEISs in ion propulsion systems of miniature spacecraft with limited on-board payloads was discussed, and the thrust was estimated within μN range. |
Databáze: | OpenAIRE |
Externí odkaz: |