Effect of Environmental and Operational Stresses on Electronic Components

Autor:	S U M Rao
Rok vydání:	1992
Předmět:	Materials science Component (thermodynamics) Oxide Failure rate law.invention Stress (mechanics) chemistry.chemical_compound Carbon film chemistry law visual_art Electronic component visual_art.visual_art_medium Degradation (geology) Electrical and Electronic Engineering Resistor Composite material
Zdroj:	IETE Technical Review. 9:256-257
ISSN:	0974-5971 0256-4602
Popis:	Laboratory and field exposure studies, under different environmental and operational stresses, are carried out to evaluate the life of electronic components. Fixed resistors (carbon film, metal oxide and metal film type) have been used for investigations. Test duration varies from 14500 to 28500 hrs. Toe performance degradation and/or failure is a result of stress on the component. It appears from the result that the Mean-Time-To-Failure (reciprocal of failure rate) of resistor is strongly related to environmental and operational stresses and the type of component.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b9ac045fe586a424b4bcd8bb7104e2f https://doi.org/10.1080/02564602.1992.11438884 Zobrazit plný text záznamu