An approach for failure prediction in H3 TRB-tests

Autor: Marius van Dijk, Felix Wuest, Stefan Trampert, Elisabeth Kolbinger, Klaus-Dieter Lang
Rok vydání: 2019
Předmět:
Zdroj: 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC).
DOI: 10.23919/empc44848.2019.8951836
Popis: Applications for power modules under harsh environmental conditions have gained importance in recent years, e.g. in offshore wind turbines. One of the critical conditions that leads to failures in these applications is humidity. Therefore, it is important to subject the power electronics to appropriate load tests in advance, in order to generate these failures. An established test method for the qualification of power electronics is the High Humidity High Temperature Reverse Bias (H3 TRB)-test. This paper deals with the prediction of failures in H3 TRB-tests. The goal in this paper is to use the currents noise to improve the method of forecasting time to failure in H3 TRB-testing. This is based on the assumption that there may be a correlation between the time to failure and the point in time at which the electrical parameters begin fluctuating.
Databáze: OpenAIRE