Methodical Approach for SEL Tolerance Confirmation of CMOS ICs at Low Temperatures

Autor:	Marina M. Novikova, Alexander A. Novikov, Alexander A. Pechenkin, Vladislav P. Lukashin, Evgeniya N Oblova, Albina R. Gritsaenko, Dmirty E. Protasov, Alexander S. Tararaksin
Rok vydání:	2021
Zdroj:	2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs53308.2021.9954467
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b527344db62874f60879b07cb31fb0c https://doi.org/10.1109/radecs53308.2021.9954467 Zobrazit plný text záznamu