Review: Ultraviolet Fluorescence as Assessment Tool for Photovoltaic Modules

Autor:	Marc Köntges, Bernhard Kubicek, Jay Lin, Gabriele C. Eder, Eckhard Fleis, Arnaud Morlier
Rok vydání:	2020
Předmět:	Computer science Photovoltaic system Electronic engineering Wafer Crystalline silicon Electrical and Electronic Engineering Condensed Matter Physics Bill of materials Ultraviolet fluorescence Electronic Optical and Magnetic Materials
Zdroj:	IEEE Journal of Photovoltaics. 10:616-633
ISSN:	2156-3403 2156-3381
DOI:	10.1109/jphotov.2019.2961781
Popis:	Since 2010, the ultraviolet fluorescence (UVF) method is used to identify defects in wafer-based crystalline silicon photovoltaic (PV) modules. We summarize all known applications of fluorescence imaging methods on PV modules to identify defects and characteristics. The aim of this review is to present the basic principles for the interpretation of UVF images. The method allows for detection of cell cracks in a chronological order of occurrence, visualizing hot parts in a PV module, and identifying deviating bill of materials of PV modules. The effects of various material combinations on the UVF are reproduced in the lab and explained for the first time. Seasonal effects on the UVF are presented for the first time. In addition, some not yet understood features in the images are shown and discussed. Furthermore, the application of UVF imaging for manual, hood-based, and drone-based inspection is presented. The analysis speed of the three methods has been measured under real conditions. For the manual inspection, we found an evaluation speed of 250 modules/h, for a hood-based system 200 modules/h and the drone-based method allows an imaging speed of up to 720 modules/h.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b4c18d5b37e387094561aa29cf1e08b https://doi.org/10.1109/jphotov.2019.2961781 Zobrazit plný text záznamu