Microstructural Characterization in Reliability Measurement of PRAM

Autor:	Gitae Jeong, Dae-Hwan Kang, S.Y. Kim, Sanghun Jeon, Jun-Soo Bae, Kyu-Charn Park, Jung-Chak Ahn, Ki-Hyun Hwang, Chilhee Chung, S.O. Park
Rok vydání:	2010
Předmět:	Materials science Reliability (statistics) Reliability engineering Characterization (materials science)
Zdroj:	Extended Abstracts of the 2010 International Conference on Solid State Devices and Materials.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b32bf8c1a986ef0d3c792879ba52f90 https://doi.org/10.7567/ssdm.2010.e-8-5l Zobrazit plný text záznamu