A beam distortion (z-scan) technique applied to the measurements of non-linearities in CdSxSe1-xdoped glasses

Autor:	G. Liakhou, Concetta Sibilia, M Bertolottie, Francesco Michelotti, F. Senesi
Rok vydání:	1992
Předmět:	Materials science business.industry General Engineering General Physics and Astronomy Near and far field Optics Transmittance Z-scan technique Step-index profile Absorption (electromagnetic radiation) business Refractive index Beam (structure) Gaussian beam
Zdroj:	Pure and Applied Optics: Journal of the European Optical Society Part A. 1:145-156
ISSN:	1361-6617 0963-9659
DOI:	10.1088/0963-9659/1/3/004
Popis:	Recently a single beam technique for measuring both the non-linear refractive index and non-linear absorption of transparent materials has been proposed by Sheik-Bahae et al. IEEE J. Quantum Electron., vol.26, p.760, 1990; in which the transmittance of a sample is measured through a finite aperture in the far field as the sample is moved along the propagation path of a focused Gaussian beam. The sign and magnitude of the non-linear refractive index and the value of absorption changes can be deduced from the transmittance curve. In the present paper this technique has been applied to evaluate both the thermal and electronic non-linear changes of refractive index and of absorption of some Schott semiconductor doped glasses by using the CW and pulsed regime.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b1713d2ca0df5a97a8bb96b1238388c https://doi.org/10.1088/0963-9659/1/3/004 Zobrazit plný text záznamu