AttSum: A Deep Attention-Based Summarization Model for Bug Report Title Generation

Autor:	Xiao Yu, Jingyu ZHANG, Yishu LI, Xiaoxue MA, Jacky KEUNG, Huiqi Zou
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality
Zdroj:	IEEE Transactions on Reliability. :1-15
ISSN:	1558-1721 0018-9529
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9acef6933fb4fedd9b131847cb20222a https://doi.org/10.1109/tr.2023.3236404 Zobrazit plný text záznamu