Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains
| Autor: | Dale McMorrow, Paul E. Dodd, G. Vizkelethy, J.R. Schwank, T.A. Hill, Marty R. Shaneyfelt, Scot E. Swanson, Scott M. Dalton, Richard S. Flores |
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| Rok vydání: | 2011 |
| Předmět: |
Nuclear and High Energy Physics
Materials science business.industry Electrical engineering Silicon on insulator Hardware_PERFORMANCEANDRELIABILITY Upset law.invention Nuclear Energy and Engineering CMOS Application-specific integrated circuit law Single event upset Electronic engineering Hardening (metallurgy) Hardware_ARITHMETICANDLOGICSTRUCTURES Electrical and Electronic Engineering business Radiation hardening Flip-flop Hardware_LOGICDESIGN |
| Zdroj: | IEEE Transactions on Nuclear Science. 58:2695-2701 |
| ISSN: | 0018-9499 |
| Popis: | Single-event upsets are studied in digital logic cells in a radiation-hardened CMOS SOI technology. The sensitivity of SEU to different strike locations and hardening approaches is explored using broadbeam and focused beam experiments. Error distributions in chains of logic flip-flops are studied to determine the impact of various cell designs and hardening techniques on upset uniformity. |
| Databáze: | OpenAIRE |
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