Autor: |
Warren Hale Lewis, John R. Rowlette, Jared D. Stack, M. Kadar Kallen |
Rok vydání: |
2002 |
Předmět: |
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Zdroj: |
Conference Proceedings LEOS'96 9th Annual Meeting IEEE Lasers and Electro-Optics Society. |
DOI: |
10.1109/leos.1996.571605 |
Popis: |
We developed a statistical model of the passive alignment process. This model allows us to calculate the distribution of VCSEL to waveguide alignment tolerances for laser micromachining of the waveguide and pedestal alignment features. Using this distribution as input for the optical model, the distribution of optical coupling efficiencies for the packaging tolerances was calculated. The coupling efficiencies for the passively aligned waveguides to the VCSEL array sources were measured and compared to the simulation results. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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