Autor: |
Dionysios Stefanakis, Konstantinos Zekentes |
Rok vydání: |
2014 |
Předmět: |
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Zdroj: |
Microelectronic Engineering. 116:65-71 |
ISSN: |
0167-9317 |
Popis: |
A systematic study of the usually employed models of 4H-SiC bandgap energy value and carrier mobility in TCAD simulations has been performed. Theoretically calculated and experimentally determined values of these parameters are compared with the corresponding models used in TCAD simulations of different research groups as well as of related software developer SILVACO. Comparisons between physical and established semi-empirical models have been made and deviations from the experimental values are observed in many reported studies. Based on this analysis, the best fitting models and the corresponding coefficients are proposed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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