Precise Laser Fault Injections into 90 nm and 45 nm SRAM-cells

Autor:	Bodo Selmke, Georg Sigl, Stefan Brummer, Johann Heyszl
Rok vydání:	2016
Předmět:	business.industry Computer science Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Chip Laser Fault (power engineering) law.invention law Embedded system Optoelectronics Static random-access memory Fault model business Field-programmable gate array Block (data storage)
Zdroj:	Smart Card Research and Advanced Applications ISBN: 9783319312705 CARDIS
Popis:	In the area of fault attacks, lasers are a common method to inject faults into an integrated circuit. Against the background of decreasing structure sizes in ICs, it is of interest which fault model can be met with state of the art equipment. We investigate laser-based fault injections into the SRAM-cells of block RAMs of two different FPGAs with 90i¾?nm and 45i¾?nm feature size respectively. Our results show that individual bit manipulations are feasible for both, the 90i¾?nm chip and the 45i¾?nm chip, but with limitations for the latter. To the best of our knowledge, we are the first to investigate laser fault injections into 45i¾?nm technology nodes. We provide detailed insights of our laser equipment and the parameters of our setupi¾?to give a comparison base for further research.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9a850b07a145e80771a7c00f3cf3c013 https://doi.org/10.1007/978-3-319-31271-2_12 Zobrazit plný text záznamu