Study of the processes of background formation in the long-wavelength region of X-Ray spectrum

Autor:	E. V. Chuparina, A. N. Smagunova, L. A. Eliseeva
Rok vydání:	2015
Předmět:	Wavelength Spectrometer Chemistry Dispersion (optics) X-ray background Analytical chemistry X-ray Atomic number Fluorescence Molecular physics Chemical composition Analytical Chemistry
Zdroj:	Journal of Analytical Chemistry. 70:949-955
ISSN:	1608-3199 1061-9348
DOI:	10.1134/s1061934815080055
Popis:	Using mathematical design of experiments we studied the spectral composition of an X-ray background in the wavelength region 0.3–1.2 nm in the X-ray fluorescence analysis (XRF) of samples with matrices composed of elements with small atomic numbers, viz plant materials. The interpretation of the results allowed us to quantitatively estimate components of X-ray background for spectrometers with wavelength dispersion and to reveal their dependence on the chemical composition of the specimens. Recommendations are formulated for the account of the background in the plant XRF.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9a64e9532381da668b021d6035738517 https://doi.org/10.1134/s1061934815080055 Zobrazit plný text záznamu Plný text ve formátu PDF