Optical and electrical study of CdZnTe surfaces passivated by KOH and NH4F solutions
| Autor: | Karel Mašek, Jakub Zázvorka, Pavel Moravec, Jan Franc, Martin Veis, M. Statelov, Jakub Pekárek |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Passivation business.industry Analytical chemistry General Physics and Astronomy Polishing 02 engineering and technology Surfaces and Interfaces General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Electron spectroscopy Isotropic etching Cadmium telluride photovoltaics Surfaces Coatings and Films X-ray photoelectron spectroscopy Ellipsometry 0103 physical sciences Optoelectronics 0210 nano-technology business Leakage (electronics) |
| Zdroj: | Applied Surface Science. 389:1214-1219 |
| ISSN: | 0169-4332 |
| Popis: | Performance of CdZnTe-based detectors is highly related to surface preparation. Mechanical polishing, chemical etching and passivation are routinely employed for this purpose. However, the relation between these processes and the detector performance in terms of underlying physical phenomena has not been fully explained. The dynamics and properties of CdZnTe surface oxide layers, created by passivation with KOH and NH4F/H2O2 solutions, were studied by optical ellipsometry and X-ray photoelectron spectroscopy (XPS). Thicknesses and growth rates of the surface oxide layers differed for each of the passivation methods. Leakage currents which influence the final spectral resolution of the detector were measured simultaneously with ellipsometry. Results of both optical and electrical investigation showed the same trends in the time evolution and correlated to each other. NH4F/H2O2 passivation showed to be a method which produces the most desirable properties of the surface oxide layer. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect