RFID Test Platform: Nonlinear Characterization

Autor:	Smail Tedjini, Gianfranco Andia Vera, Yvan Duroc
Rok vydání:	2014
Předmět:	Engineering business.industry Electrical engineering Impedance matching Power (physics) Nonlinear system Ultra high frequency Harmonic Electronic engineering Radio-frequency identification Electrical and Electronic Engineering business Joint (audio engineering) Instrumentation Electrical impedance
Zdroj:	IEEE Transactions on Instrumentation and Measurement. 63:2299-2305
ISSN:	1557-9662 0018-9456
DOI:	10.1109/tim.2014.2307754
Popis:	This paper presents a complete radio frequency identification (RFID) test platform to characterize the nonlinear effects produced by passive ultra-high frequency (UHF) RFID chips. In full operation mode, automated measurements of activation power, harmonic response level, and impedances are performed in a wide frequency range up to the fourth harmonic. The characterization method, platform composition, and operation are explained through real measurements on UHF Class-1 Generation-2 chips. A harmonic treatment is presented thanks to the joint use of an RFID tester and impedance tuners, and the effect of the antenna-chip impedance matching on the harmonic responses is compared before and after treatment. To the best of our knowledge, no similar platform has been presented in the literature.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9a20cd2ae676b6504c344a7918d05e38 https://doi.org/10.1109/tim.2014.2307754 Zobrazit plný text záznamu