Autor:	R.D. Bates
Rok vydání:	2002
Předmět:	Membrane probe Automatic test equipment Engineering business.industry Universal solution Electrical engineering Test requirements Wafer USable business Probe card Gold alloys
Zdroj:	ITC
DOI:	10.1109/test.1997.639661
Popis:	Epoxy Ring, Cobra, and other new products are evaluated against the demand for high pin count, high frequency, high temperature, multi-DUT, long life, etc. There doesn't appear to be a single universal solution, but rather each technology provides a usable response to the growing wafer test requirements. However, the climate is right for creativity and innovation to meet the challenges of the future.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::99a081f15e288dafea1b56167dcfa913 https://doi.org/10.1109/test.1997.639661 Zobrazit plný text záznamu