A built-in self-repair analyzer (CRESTA) for embedded DRAMs

Autor:	M. Hamada, Hideto Hidaka, Tomoya Kawagoe, T. Ooishi, Jun Ohtani, M. Niiro
Rok vydání:	2002
Předmět:	Spectrum analyzer Engineering Hardware_MEMORYSTRUCTURES Built-in self-test business.industry Embedded system CRESTA Built in self repair Automatic test pattern generation business Dram
Zdroj:	ITC
DOI:	10.1109/test.2000.894250
Popis:	A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum operation speed around 200 MHz+.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::99173fb36eed7c66d1b4e4f8de8da5b2 https://doi.org/10.1109/test.2000.894250 Zobrazit plný text záznamu