Production quality characterisation techniques of sensors and prototypes for the BELLE II Pixel Detector
| Autor: | Jelena Ninkovic, Ladislav Andricek, M. Schnecke, Florian Schopper, P. Avella, A. Ritter, E. Scheugenpflug, Gerhard Schaller, R. Lehmann, Christian Koffmane, A. Wassatsch, Manfred Valentan, Gerhard Liemann, Robert Richter, H. G. Moser |
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| Rok vydání: | 2015 |
| Předmět: |
Physics
Physics::Instrumentation and Detectors business.industry Detector Electrical engineering Upgrade Semiconductor Physics::Accelerator Physics High Energy Physics::Experiment Field-effect transistor Vertex detector business Instrumentation Mathematical Physics Production quality Beam (structure) Pixel detector |
| Zdroj: | Journal of Instrumentation. 10:C01049-C01049 |
| ISSN: | 1748-0221 |
| Popis: | The Belle II detector is a system currently under upgrade at the B-factory SuperKEKB in Tsukuba, Japan. The main novelty is the introduction of an additional position sensitive sub-detector in the vertex detector, between the beam pipe and the strip detector system. The sensor of choice for the Belle II Pixel Detector is the Depleted p-channel Field Effect Transistor (DEPFET) sensor. In this paper the latest production of sensors and prototypes performed at the semiconductor Laboratory of the Max Planck Society, i.e. the PXD9 and the Electrical Multi-Chip Module (EMCM), are described. Wafer-level characterisation methods and techniques for faults in the metal system are also reported. |
| Databáze: | OpenAIRE |
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