SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance
| Autor: | Wan Yen Lin, Ming-Dou Ker, Cheng-Cheng Yen |
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| Rok vydání: | 2014 |
| Předmět: |
Engineering
Electrostatic discharge Disturbance (geology) Firmware business.industry Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics computer.software_genre Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Silicon-controlled rectifier Hardware_GENERAL Hardware_INTEGRATEDCIRCUITS Electronic engineering System level Microelectronics Transient (oscillation) Electrical and Electronic Engineering Safety Risk Reliability and Quality Cmos process business computer Hardware_LOGICDESIGN |
| Zdroj: | Microelectronics Reliability. 54:71-78 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/j.microrel.2013.08.010 |
| Popis: | A new silicon controlled rectifier (SCR)-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance is proposed. The circuit function to detect positive or negative electrical transients during system-level electrostatic discharge (ESD) and electrical fast transient (EFT) tests has been verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level electrical transient disturbance events. The detection results can be cooperated with firmware design to execute system recovery procedures, therefore the immunity of microelectronic systems against system-level ESD or EFT tests can be effectively improved. |
| Databáze: | OpenAIRE |
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