Bayesian Inference of a Series System on Weibull Step-Stress Accelerated Life Tests with Dependent Masking

Autor: Tsai Hung Fan, Kuan Jung Peng, Tsung Ming Hsu
Rok vydání: 2013
Předmět:
Zdroj: Quality Technology & Quantitative Management. 10:291-303
ISSN: 1684-3703
DOI: 10.1080/16843703.2013.11673415
Popis: We will discuss the reliability analysis of a series system under the step-stress accelerated lifetime test with Type-I censoring scheme while the components are assumed to have independent and non-identical Weibull lifetime distributions and the lifetime of each component all follows the cumulative exposure model. In many cases, the exact component causing the failure of the system cannot be identified and the cause of failure is masked. We adopt the log-linear relationship between the stress variables and the Weibull scale parameters and apply the Bayesian analysis from masked system life data when the probability of masking is dependent on different components. Further, the reliability of the system and components are estimated under usual operating conditions. The proposed method is illustrated through a simulation study.
Databáze: OpenAIRE