Composite Mass-Transfer Method for Reducing Effect of Mura and Defects in mLED Wafer

Autor: Shin Yamada, Hiroaki Ito, Yohei Sato, Toshihiko Fujiwara, Kunio Imaizumi, Takeshi Yokoyama, Noriyuki Yamawaki, Nobuyuki Hasegawa, Tokuro Ozawa, Shinji Yuda
Rok vydání: 2022
Předmět:
Zdroj: Proceedings of the International Display Workshops. :280
ISSN: 1883-2490
Databáze: OpenAIRE