Evolution of structural and magnetic properties in Ta/Ni81Fe19multilayer thin films

Autor:	R. M. Valletta, I. Hashim, Harry A. Atwater, K. T. Y. Kung
Rok vydání:	1993
Předmět:	Condensed Matter::Materials Science Grain growth Materials science Condensed matter physics Metallurgy General Physics and Astronomy Grain boundary diffusion coefficient Grain boundary Crystallite Coercivity Atmospheric temperature range Thin film Microstructure
Zdroj:	Journal of Applied Physics. 74:458-464
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.355252
Popis:	The interdiffusion kinetics in short period (12.8 nm) Ta/Ni81Fe19 polycrystalline multilayer films has been investigated and related to the evolution of soft magnetic properties upon thermal annealing in the temperature range 300-600-degrees-C. Small angle x-ray diffraction and transmission electron microscopy were used to estimate the multilayer period. Interdiffusion in the multilayers was directly computed from the decay of the satellites near (000) in a small angle x-ray diffraction spectrum. A kinetic analysis of interdiffusion suggests that grain growth is concurrent with grain boundary diffusion of Ta in Ni81Fe19. The evolution of soft magnetic properties of Ni81Fe19, i.e., lowering of 4piM(s) and increase in coercivity H(c), also lend support to the above analysis.
Databáze:	OpenAIRE
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