Predicting Failure Distributions of SRAM Arrays by using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning

Autor:	T. Pompl, T. Khan Bashir, M. Voelker, F. Last, M. Ostermayr
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Device and Materials Reliability. :1-1
ISSN:	1558-2574 1530-4388
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::987806c028e2ca159ed158f4ac214d93 https://doi.org/10.1109/tdmr.2023.3277137 Zobrazit plný text záznamu