Autor: |
Paul A. Hyde, Richard Q. Williams, Jonghae Kim, W. Clark, V. Karam, B.J. Gross, Jean-Olivier Plouchart, Robert Trzcinski, Kun Wu, Myung-Hee Na, J. Mc Cullen |
Rok vydání: |
2006 |
Předmět: |
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Zdroj: |
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.. |
DOI: |
10.1109/iedm.2005.1609540 |
Popis: |
This paper reports the SOI 90 nm statistical model to hardware correlation achieved over a broad voltage, temperature and a variety of five different ring oscillators. Monte Carlo simulations were performed and compared with the measured circuit statistical population. A sub-ps model to hardware correlation accuracy was achieved between the mean hardware and simulated delays. Based on the model validation, a parasitic aware layout optimization was performed on a constrained and an unconstrained inverter leading to a 5 and 66 % reduction in delay of the inverter reference circuit. The unconstrained parasitic aware optimization achieves a record inverter switching delay of 1.94 ps |
Databáze: |
OpenAIRE |
Externí odkaz: |
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