Autor:	J. P. Buban, R. W. Aderholdt, D. R. Womack, D. G. Berghaus
Rok vydání:	1974
Předmět:	Photoelasticity Scanner Materials science Optics Mechanics of Materials business.industry Mechanical Engineering Incident beam Physics::Optics Aerospace Engineering Scattered light Polarization (waves) business
Zdroj:	Experimental Mechanics. 14:505-506
ISSN:	1741-2765 0014-4851
DOI:	10.1007/bf02323153
Popis:	Devices which simplify the collection and improve the quality of scattered-light photoelastic data are described. These devices include electromechanically controlled optics for varying the polarization of the incident-light beam and a photometric scanner for observing the scattered-light fringes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::982bf662fe5a3158436981844202b8a7 https://doi.org/10.1007/bf02323153 Zobrazit plný text záznamu Full text from SpringerLink