Design and analysis of Yb doped ZnO (YZO) and P–Si bilayer nano-stacked reflector for optical filter applications
| Autor: | Richa Singh, Lucky Agarwal, K. SambasivaRao, Gaurav Varshney, Shweta Tripathi |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Total internal reflection Materials science business.industry Bilayer Reflector (antenna) 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Ray Wavelength Stack (abstract data type) Ellipsometry 0103 physical sciences Optoelectronics General Materials Science Electrical and Electronic Engineering 0210 nano-technology Optical filter business |
| Zdroj: | Superlattices and Microstructures. 146:106670 |
| ISSN: | 0749-6036 |
| DOI: | 10.1016/j.spmi.2020.106670 |
| Popis: | In the present paper, a multilayer stack of Yb doped ZnO (YZO) and p-Si has been designed in which the total internal reflection of optical light is combined to form constructive interference. The mechanism behind light propagation in a stack is revealed, and factors affecting the reflectivity of the stacked reflector are analytically investigated. In the visible range, an optimized reflectivity up to 99.3% is reached from two bilayer stacks. The thickness of stack layers is optimized to validate Fresnel's Law and the same has been further authenticated by the experimental results obtained from the ellipsometer. The device structure is numerically analyzed using the full wave simulator CST microwave studio. Furthermore, the reflector bands are linearly reconfigured by angular manipulation of the incident light. The experimental and simulated outcome of the multilayer stacked reflector shows the highest reflectivity of 99.3% for 550 nm wavelength of visible frequency spectrum. |
| Databáze: | OpenAIRE |
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