Software Defect Distribution Prediction for BOSS System

Autor: Wan Jiang Han, Yi Sun, Tian Bo Lu, He Yang Jiang
Rok vydání: 2014
Předmět:
Zdroj: Applied Mechanics and Materials. :67-70
ISSN: 1662-7482
DOI: 10.4028/www.scientific.net/amm.701-702.67
Popis: Effective detection of software defects is an important activity of software development process. In this paper, we propose an approach to predict residual defects for BOSS project, which applies defect distribution model. Experiment results show that this approach can effectively improve the accuracy of defect prediction.
Databáze: OpenAIRE