Investigation of lead surface segregation during germanium–lead epitaxial growth

Autor:	Xiuli Li, Fengshuo Wan, Chunlai Xue, Linzhi Peng, Zhi Liu, Chaoqun Niu, Yuhua Zuo, Jun Zheng, Xiangquan Liu, Buwen Cheng
Rok vydání:	2020
Předmět:	Materials science Scanning electron microscope Mechanical Engineering Analytical chemistry chemistry.chemical_element Germanium Sputter deposition Epitaxy Nanocrystalline material Crystal chemistry Mechanics of Materials Transmission electron microscopy General Materials Science Crystallite
Zdroj:	Journal of Materials Science. 55:4762-4768
ISSN:	1573-4803 0022-2461
DOI:	10.1007/s10853-019-04334-6
Popis:	Crystalline germanium–lead (GePb) alloys were deposited on Ge(100) substrates via magnetron sputtering epitaxy. Strip-shaped Pb segregation along the direction was observed on the Ge0.976Pb0.024 film surface, as revealed by scanning electron microscopy. The chemical compositions and structural properties of the strip-shaped segregation were investigated by energy-dispersive X-ray spectroscopy, cross-sectional transmission electron microscopy and micro-Raman scattering spectra. The Ge0.976Pb0.024 film remained high crystal quality even after Pb segregation. The strip-shaped segregation was mainly composed of polycrystalline Pb, and its surface was covered with a GePb nanocrystalline layer.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::97eb279c1d4c3d804698e88a34b3f15c https://doi.org/10.1007/s10853-019-04334-6 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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