Preparation and analysis of cross-sections of etched and unetched CdSe semiconductor thin films

Autor:	G.J. Houston, J.F. McCann, D. Haneman
Rok vydání:	1982
Předmět:	Semiconductor thin films Materials science Etching (microfabrication) Scanning electron microscope Microscopy General Engineering Analytical chemistry Electron microprobe Thin film X ray analysis Microanalysis
Zdroj:	Solar Energy Materials. 7:139-147
ISSN:	0165-1633
DOI:	10.1016/0165-1633(82)90079-x
Popis:	Details are given of a technique that has been used to prepare cross-sections of electrodeposited CdSe films on Ni substrates. The cross-sectional views permit the direct measurement of the thicknesses of CdSe films. Optical and scanning electron microscope photographs as well as the results of electron microprobe scans and EDX analyses across the cross-sections are presented. The results of etching on CdSe film-thickness are described.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::97851e2152c51fbdb6d174c8119d390e https://doi.org/10.1016/0165-1633(82)90079-x Zobrazit plný text záznamu