Autor: |
V. A. Pustovarov, T.V. Shtang, V. S. Kortov |
Rok vydání: |
2015 |
Předmět: |
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Zdroj: |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 353:42-45 |
ISSN: |
0168-583X |
DOI: |
10.1016/j.nimb.2015.04.039 |
Popis: |
Luminescent spectroscopy is used to show formation of new trapping centers of charge carriers in anion-defective alumina crystals at radiation-induced transformations of F and F + -centers created by oxygen vacancies when exposed to high-dose gamma-radiation. A new wide band in the range 440–700 nm was registered in the photoluminescence spectrum at excitations with UV photons. High-dose irradiation of the crystals leads to appearance of F 2 -type aggregate centers in different charged states. These centers are additional traps of charge carriers. The new traps increase a luminescent yield at high-dose irradiation with gamma-rays and an electron beam. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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