Ellipsometric study of anodic oxide films formed on niobium surfaces
| Autor: | Abdurauf Prusi, Ljubomir Arsov, Irena Arsova |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Materials science
Open-circuit voltage Niobium Analytical chemistry Oxide chemistry.chemical_element Polishing Condensed Matter Physics Electrochemistry Cathodic protection Electropolishing chemistry.chemical_compound chemistry Chemical engineering General Materials Science Electrical and Electronic Engineering Refractive index |
| Zdroj: | Journal of Solid State Electrochemistry. 7:217-222 |
| ISSN: | 1432-8488 |
| DOI: | 10.1007/s10008-002-0303-6 |
| Popis: | Anodic oxide films formed potentiostatically on niobium surfaces, from open circuit potential (OCP) to 10 V, were studied by performing in situ and ex situ ellipsometric measurements. The kinetics of the film thickness growth in 1 M H2SO4 and complex indices of refraction of these films were determined. A strong influence of the surface preparation conditions on the complex refractive indices of the metal substrate and anodic oxide films was shown. By steady-state measurements at OCP, a small thickening of the natural air-formed oxide film with chemical composition Nb2O5 in 1 M H2SO4 solution was detected. With cathodic pre-treatment, only partial reduction and small thinning of the natural air-formed oxide film was possible. The thicknesses of the natural air-formed oxide films on fine mechanically polished and electropolished Nb surfaces were determined. The build up of the natural air-formed oxide film, at ex situ conditions, on the already formed anodic oxide films was confirmed. It was shown that electropolishing gives more similar optical surface properties to the bare metal than the fine mechanical polishing. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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