A comparison of observed and simulated scanning tunneling images of the reconstructed GaAs(001) surface

Autor: Clarence Cherian Matthai, J. M. C. Thornton, M. D. Jackson, J. M. Bass, Peter Weightman
Rok vydání: 1995
Předmět:
Zdroj: Materials Science and Engineering: B. 35:489-492
ISSN: 0921-5107
DOI: 10.1016/0921-5107(95)01348-2
Popis: We have generated scanning tunneling microscopy images of the reconstructed GaAs(001) surface using an ab initio pseudopotential method and the Bardeen tansfer Hamiltonian approximation. These images are compared with observed images for different bias voltages. We find that there is a strong correlation between theory and experiment.
Databáze: OpenAIRE