Autor: |
Clarence Cherian Matthai, J. M. C. Thornton, M. D. Jackson, J. M. Bass, Peter Weightman |
Rok vydání: |
1995 |
Předmět: |
|
Zdroj: |
Materials Science and Engineering: B. 35:489-492 |
ISSN: |
0921-5107 |
DOI: |
10.1016/0921-5107(95)01348-2 |
Popis: |
We have generated scanning tunneling microscopy images of the reconstructed GaAs(001) surface using an ab initio pseudopotential method and the Bardeen tansfer Hamiltonian approximation. These images are compared with observed images for different bias voltages. We find that there is a strong correlation between theory and experiment. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|