Autor:	V.A. Vardanian, Karen Darbinyan, Yervant Zorian, G. Harutyunyan, Samvel Shoukourian
Rok vydání:	2011
Předmět:	Engineering Built-in self-test business.industry Test algorithm Embedded system Key (cryptography) System on a chip Algorithm design Embedded memory business Maintenance engineering Test (assessment)
Zdroj:	Asian Test Symposium
DOI:	10.1109/ats.2011.98
Popis:	This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::96905f9ee80c367030c118fcc58b5880 https://doi.org/10.1109/ats.2011.98 Zobrazit plný text záznamu