| Autor: |
Sunil Kumar Khatri, D. Damodaran, Lipika Goel, Mayank Sharma |
| Rok vydání: |
2017 |
| Předmět: |
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| Zdroj: |
2017 4th IEEE Uttar Pradesh Section International Conference on Electrical, Computer and Electronics (UPCON). |
| DOI: |
10.1109/upcon.2017.8251131 |
| Popis: |
In the area of defect prediction most of the literature comprises of within project defect prediction. It is always not feasible to have the historical data of the similar projects for predictions. Therefore, CPDP (Cross Project Defect Prediction) as a subset of defect prediction in general has become a popular topic in research these days. In this paper, we present a systematic review of the CPDP. This paper summarizes the different methodologies used by various authors. A great amount of variation and heterogeneity is observed in the prediction process. The variations in the datasets, the learners, metric selection and the standard measure for comparisons are a challenge to determine the best practice for CPDP. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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