Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures

Autor: S. Kiatgamolchai, E. H. C. Parker, V. G. Kantser, O.A. Mironov, T. E. Whall, Maksym Myronov
Rok vydání: 2003
Předmět:
Zdroj: Proceedings. International Semiconductor Conference.
DOI: 10.1109/smicnd.2002.1105881
Popis: The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows one to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classical magnetoconductivity tensor in semiconductor multilayer structures. The advantages of the ME-MSA as compared to the MSA are demonstrated using a synthetic data set.
Databáze: OpenAIRE