High detectivity dilute nitride strained layer superlattice detectors for LWIR and VLWIR applications

Autor:	Ayub Fathimulla, H. Hier, Matthew Coppinger, Leye Aina, Mark Lecates, James Kolodzey, Nurpur Bhargava, Keith W. Goossen
Rok vydání:	2009
Předmět:	Materials science business.industry Superlattice Detector Photodetector Nitride Condensed Matter Physics Epitaxy Atomic and Molecular Physics and Optics Particle detector Electronic Optical and Magnetic Materials Wavelength Optoelectronics business Leakage (electronics)
Zdroj:	Infrared Physics & Technology. 52:310-316
ISSN:	1350-4495
DOI:	10.1016/j.infrared.2009.05.011
Popis:	This paper will describe the first-of-a-kind development and demonstration of dilute nitride strained layer superlattice detectors with detectivity as high as 4 × 10 10 cm Hz 1/2 /W and cut-off wavelength of 11-μm for an LWIR design and a cut-off wavelength of 22-μm for a VLWIR design. The developed dilute nitride SLS detectors are based on ultra-low leakage dilute nitride epitaxial layers and/or strained layer superlattices (SLS) of InAs/InAsSbN and InAs/GaInSbN that could enable high VLWIR detectivities at elevated temperatures and at low cost.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::961bed1bc95575ff2320c448e3c29782 https://doi.org/10.1016/j.infrared.2009.05.011 Zobrazit plný text záznamu Full Text from ScienceDirect