Standard and electrically detected magnetic resonance in nanocrystalline silicon
| Autor: | R. Brüggemann, W. Bronner, M Mehring |
|---|---|
| Rok vydání: | 2000 |
| Předmět: |
Photon
Electrically detected magnetic resonance Chemistry Analytical chemistry Nanocrystalline silicon Dangling bond Chemical vapor deposition Condensed Matter Physics Electronic Optical and Magnetic Materials Condensed Matter::Materials Science symbols.namesake Attenuation coefficient Materials Chemistry Ceramics and Composites symbols Spin density Raman spectroscopy |
| Zdroj: | Journal of Non-Crystalline Solids. :534-539 |
| ISSN: | 0022-3093 |
| DOI: | 10.1016/s0022-3093(99)00844-3 |
| Popis: | We present results from standard and electrically detected magnetic resonance on nanocrystalline silicon from hot-wire and plasma-enhanced chemical vapour deposition for which the Raman spectra showed the same large crystalline fraction. Based on the fact that dangling bond spin density scales with the sub-band gap absorption coefficient at photon energies |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect