Automatic testing of MMIC wafers
| Autor: | Jon Jorgenson, Gary K. Lewis, Inder J. Bahl |
|---|---|
| Rok vydání: | 1991 |
| Předmět: |
Engineering
Noise measurement business.industry General Engineering ComputerApplications_COMPUTERSINOTHERSYSTEMS Hardware_PERFORMANCEANDRELIABILITY Power (physics) Hardware_INTEGRATEDCIRCUITS Ic production Calibration Electronic engineering Wafer business Automatic testing Microwave Monolithic microwave integrated circuit |
| Zdroj: | International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering. 1:77-89 |
| ISSN: | 1522-6301 1050-1827 |
| DOI: | 10.1002/mmce.4570010108 |
| Popis: | Microwave probes are used extensively for linear and nonlinear characterization of microwave devices on wafer and are commercially available for use at frequencies up to 65 GHz. An on-wafer noise measurement test system, for discrete devices, is now commercially available and on-wafer power measurement techniques are emerging slowly. These probes are also getting more recognition for the testing of packaged chips, packages, and modules. More accurate calibration techniques and their on-wafer validation are being developed. Automatic testing of MMIC wafers, using an integrated test system, is a key requirement for the development of low-cost IC production. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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