Analysis of reliability of semiconductor emitters with different designs of cavities
| Autor: | K. V. Kurnosov, A. S. Meshkov, V. D. Kurnosov, A. V. Lobintsov, V. N. Penkin, M. B. Uspenskii, Yu. V. Kurnyavko, V I Romantsevich, R. V. Chernov, A. V. Ivanov |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Physics and Astronomy (miscellaneous) business.industry Laser 01 natural sciences law.invention 010309 optics Optics Reliability (semiconductor) Semiconductor Fiber Bragg grating law 0103 physical sciences Operating time Optoelectronics A fibers business Diode |
| Zdroj: | Technical Physics. 61:1525-1530 |
| ISSN: | 1090-6525 1063-7842 |
| Popis: | We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered. |
| Databáze: | OpenAIRE |
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