A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials
| Autor: | Jochen Wieser, K. Butrouna, Kenneth R. Graham, Alex M. Boehm |
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| Rok vydání: | 2017 |
| Předmět: |
Valence (chemistry)
Photon business.industry Chemistry Photoemission spectroscopy 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences Electronic Optical and Magnetic Materials Biomaterials Organic semiconductor Laser linewidth Materials Chemistry Density of states Optoelectronics Emission spectrum Electrical and Electronic Engineering Atomic physics 0210 nano-technology business Ultraviolet photoelectron spectroscopy |
| Zdroj: | Organic Electronics. 41:9-16 |
| ISSN: | 1566-1199 |
| Popis: | Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude. |
| Databáze: | OpenAIRE |
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