Thickness dependence of the Maxwell-Wagner-Sillars dielectric relaxation dynamics in semicrystalline fluorinated parylene

Autor:	M. Bechara, Sombel Diaham, M. L. Locatelli
Rok vydání:	2011
Předmět:	chemistry.chemical_classification Materials science Dielectric Polymer law.invention chemistry.chemical_compound Crystallinity Nuclear magnetic resonance Parylene chemistry law X-ray crystallography Relaxation (physics) Crystallite Crystallization Composite material
Zdroj:	2011 - 14th International Symposium on Electrets.
DOI:	10.1109/ise.2011.6085017
Popis:	In summary, the effect of film thicknesses between 1.4 and 49.4 µm on the MWS relaxation in PA-F polymer films have been studied by broadband dielectric spectroscopy in wide temperature (20 °C to 400 °C) and frequency (100 mHz to 1 MHz) ranges. At the lowest frequencies, the variation of έ and tanδ with temperature shows the presence of the MWS relaxation. The results show a good correlation between the PA-F crystallinity increase (crystallite size growth as revealed by XRD results.) with increasing film thickness and the. shift of the MWS relaxation towards higher temperature and lower frequency.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::95534e46028799d9d0f3782312b2d703 https://doi.org/10.1109/ise.2011.6085017 Zobrazit plný text záznamu