Total-Ionizing-Dose Effects in Nanotube Tunnel Field-Effect Transistor with Bias-Induced Electron-Hole Bilayer

Autor:	Xue-Ke Wang, Ya-Bin Sun, Yun Liu, Xiao-Jin Li, Yan-Ling Shi
Rok vydání:	2022
Zdroj:	2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::94b8c88ed3843d4f575c609254098d53 https://doi.org/10.1109/icsict55466.2022.9963313 Zobrazit plný text záznamu