| Popis: |
Increasing the level of semiconductor devices, improving their characteristics significantly affects the potential stability in a wide range of frequencies. Classical methods and standard measuring equipment are not designed to measure the parameters of potentially unstable transistors. Measuring systems are excited uncontrollably, which increases the measurement error. Therefore, today there is an urgent task of measuring the parameters of both transistors in particular and quadrupoles in general, in the frequency range of potential instability. The clock frequency at which modern computer equipment works is close to the microwave range (ultrahigh frequencies), which makes the problem of measuring and calculating the various functional units of the computer quite relevant. The development of new methods and means of measuring the parameters of potentially unstable quadrupoles in the microwave range is an important scientific field that can significantly improve the accuracy of their measurement on standard equipment. The conducted researches and the developed technique allow to increase accuracy of measurement of parameters of four-poles and to provide stability of experimental installation at measurement of parameters of any four-pole. The proposed methods are more efficient and solve the problem of measuring the S-parameters of potentially unstable quadrupoles in the microwave range. The parameters of the quadrupole have the dimensions of the elements of standard W-parameters, their measurements are performed in the microwave range with an error of less than 5%, and to a lesser extent depends on the coefficient of stability of the measuring path than when measuring S-parameters. When measuring the parameters of the quadrupole, there is no need to use the modes of short circuit and XX or make measurements with a coordinated measuring path, which allows to increase the measurement accuracy and ensure stability when measuring potentially unstable quadrupoles with Ks> 0. |
