Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography
| Autor: | Jon Molina-Aladareguia, Nikhilesh Chawla, Carl R. Mayer |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Toughness Nanostructure Materials science Waviness business.industry Mechanical Engineering 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Microstructure 01 natural sciences Focused ion beam Finite element method Optics Mechanics of Materials 0103 physical sciences General Materials Science Tomography Composite material 0210 nano-technology business Layer (electronics) |
| Zdroj: | Materials Characterization. 120:369-376 |
| ISSN: | 1044-5803 |
| DOI: | 10.1016/j.matchar.2016.09.023 |
| Popis: | Al-SiC nanolaminate composites show promise as high performance coating materials due to their combination of strength and toughness. Although a significant amount of modeling effort has been focused on materials with an idealized flat nanostructure, experimentally these materials exhibit complex undulating layer geometries. This work utilizes FIB tomography to characterize this nanostructure in 3D and finite element modeling to determine the effect that this complex structure has on the mechanical behavior of these materials. A sufficiently large volume was characterized such that a 1 × 2 μm micropillar could be generated from the dataset and compared directly to experimental results. The mechanical response from this nanostructure was then compared to pillar models using simplified structures with perfectly flat layers, layers with sinusoidal waviness, and layers with arc segment waviness. The arc segment based layer geometry showed the best agreement with the experimentally determined structure, indicating it would be the most appropriate geometry for future modeling efforts. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect