Testing Contaminated Insulators at Project UHV for Voltage Levels of the Future

Autor:	K. J. Lloyd
Rok vydání:	1981
Předmět:	Engineering business.industry General Engineering Electrical engineering System testing Electrical and Electronic Engineering Contamination business Reliability engineering Voltage
Zdroj:	IEEE Transactions on Electrical Insulation. :220-223
ISSN:	0018-9367
DOI:	10.1109/tei.1981.298420
Popis:	The facilities of Project UHV for performing tests on contaminated insulators are presented. Included are discussions on the indoor and outdoor testing capabilities ties and limitations; problems that have been encountered in the early phases of dc testing; and attempts at developing alternate methods for contaminating. The discussions contained in this paper are directed to testing levels of the future: 1200kV rms or higher, and +(or-) 600, +(or-) 800kV dc or higher.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::945ceaa426cb7e8452efe094b106a77e https://doi.org/10.1109/tei.1981.298420 Zobrazit plný text záznamu